| BIT QUANTITY | 65536 |
| BODY HEIGHT | 0.100 INCHES MAXIMUM |
| BODY LENGTH | 0.358 INCHES MAXIMUM |
| BODY WIDTH | 0.358 INCHES MAXIMUM |
| CASE OUTLINE SOURCE AND DESIGNATOR | C-4 MIL-M-38510 |
| CRITICALITY CODE JUSTIFICATION | CBBL |
| FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND MONOLITHIC AND PROGRAMMED AND 3-STATE OUTPUT AND BIPOLAR |
| INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
| INCLOSURE MATERIAL | CERAMIC AND GLASS |
| INPUT CIRCUIT PATTERN | 14 INPUT |
| MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
| MEMORY DEVICE TYPE | PROGRAMMED |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, PROGRAMMED (PROM 93Z665A) |
| OPERATING TEMP RANGE | -55.0 TO 125.0 CELSIUS |
| OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| SPECIAL FEATURES | ALTERED ITEM, MADE FROM DEVICE 82009023X, CAGE 14933, MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 64K (8K X 8) PROM, MONOLITHIC SILICON; PROGRAM P/N 7816354P758 |
| STORAGE TEMP RANGE | -65.0 TO 150.0 CELSIUS |
| TERMINAL TYPE AND QUANTITY | 20 LEADLESS |
| TERMINAL SURFACE TREATMENT | SOLDER |
| TEST DATA DOCUMENT | 96906-MIL-STD883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TIME RATING PER CHACTERISTIC | 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.3 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| WORD QUANTITY | 8192 |