| ANODE TYPE | SOLID |
| NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 85.0 DEG CELSIUS MAXIMUM |
| TERMINAL SURFACE TREATMENT | SOLDER |
| TERMINAL LENGTH | 0.050 INCHES NOMINAL |
| DC LEAKAGE AT REFERENCE TEMP | 3.000 MICROAMPERES |
| CAPACITIVE ELECTRODE MATERIAL | TANTALUM |
| NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 25.0 DC SINGLE SECTION |
| TERMINAL TYPE AND QUANTITY | 2 BONDING PAD |
| BODY LENGTH | 0.265 INCHES NOMINAL |
| RELIABILITY INDICATOR | ESTABLISHED |
| BODY STYLE | CHIP TYPE |
| RELIABILITY FAILURE RATE LEVEL IN PERCENT | 0.010 |
| DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT | 6.000 |
| ELECTRICAL POLARIZATION | POLARIZED |
| SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S) |
| BODY WIDTH | 0.110 INCHES NOMINAL |
| CAPACITANCE VALUE PER SECTION | 10.000 MICROFARADS SINGLE SECTION |
| BODY HEIGHT | 0.110 INCHES NOMINAL |
| TEST DATA DOCUMENT | 81349-MIL-C-55365 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). |
| DC LEAKAGE AT MAXIMUM OPERATING TEMP | 30.0 MICROAMPERES |
| SPECIFICATION/STANDARD DATA | 81349-MIL-C-55365/4 GOVERNMENT SPECIFICATION |
| CASE MATERIAL | CERAMIC |
| TOLERANCE RANGE PER SECTION | -10.00/+10.00 PERCENT SINGLE SECTION |